4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Darlene G. Hamilton

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Address sequencer within BIST (Built-in-Self-Test) system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Charge injection

Static information storage and retrieval – Floating gate – Multiple values
Reexamination Certificate

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Data retention characteristics as a result of high...

Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate

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Dummy wordline for erase and bitline leakage

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate

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Elimination of n+ contact implant from flash...

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
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Profile ID: LFUS-PAI-P-2126927

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