4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Signal generation or waveform shaping

Dariusz Czysz

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Low power decompression of test cubes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Low power scan testing techniques and apparatus

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2294241

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