4. Optics: measuring and testing
  5. By light interference
  6. Rotation rate

Dan W. Youngner

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Chip scale atomic gyroscope

Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate

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Chip scale atomic gyroscope

Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate

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MEMS frequency standard for devices such as atomic clock

Oscillators – Molecular or particle resonant type
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Thin-film deposition methods and apparatuses

Coating processes – Coating by vapor – gas – or smoke – Base includes an inorganic compound containing silicon or...
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Profile ID: LFUS-PAI-P-2403500

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