4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Earth science

Colleen Kane Steward

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Electronic device parameter estimator and method therefor

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Electronic device parameter estimator and method therefor

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Patent

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Processor power consumption estimator that using instruction and

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Patent

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Profile ID: LFUS-PAI-P-1062807

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