4. Coded data generation or conversion
  5. Analog to or from digital conversion
  6. Differential encoder and/or decoder

Clarence K. L. Tam

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Method and device for use in DC parametric tests

Coded data generation or conversion – Analog to or from digital conversion – Differential encoder and/or decoder
Reexamination Certificate

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Method and device for use in DC parametric tests

Coded data generation or conversion – Analog to or from digital conversion – Differential encoder and/or decoder
Reexamination Certificate

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System and method for testing integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2732109

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