Method and device for use in DC parametric tests

Details Method and device for use in DC parametric tests Method and device for use in DC parametric tests

2005-07-12

2005-07-12

JeanPierre, Peguy (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Differential encoder and/or decoder

C341S120000

Reexamination Certificate

active

06917320

ABSTRACT:
A system and device suitable for use in performing a DC parametric test on an external load is provided. The device may be configured to apply a desired voltage or current to the external load. The circuit device receives a forcing parameter signal at an input and releases at an output a signal approximating the forcing parameter signal to the external load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and an internal load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point. The application of second voltage signal to the intermediate voltage point causes a change in either one of the voltage signal or the current signal at the output such that a signal approximating the forcing parameter signal is caused at the output. A current measuring circuit adapted for providing a measure of the current at the external load suitable for use with a voltage generating circuit device is also provided.

REFERENCES:
patent: 2605361 (1952-07-01), Cutler
patent: 4593270 (1986-06-01), White
patent: 4641246 (1987-02-01), Halbert et al.
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4792748 (1988-12-01), Thomas et al.
patent: 4792932 (1988-12-01), Bowhers et al.
patent: 4816750 (1989-03-01), Van der Kloot et al.
patent: 4875210 (1989-10-01), Russo et al.
patent: 5025205 (1991-06-01), Mydill et al.
patent: 5103230 (1992-04-01), Kalthoff et al.
patent: 5270582 (1993-12-01), Brown et al.
patent: 5274375 (1993-12-01), Thompson
patent: 5321700 (1994-06-01), Brown et al.
patent: 5321702 (1994-06-01), Brown et al.
patent: 5369604 (1994-11-01), Ravindranath et al.
patent: 5512895 (1996-04-01), Madden et al.
patent: 5568493 (1996-10-01), Morris
patent: 5610826 (1997-03-01), Whetsel
patent: 5744949 (1998-04-01), Whetsel
patent: 5812469 (1998-09-01), Nadeau-Dostie et al.
patent: 5867054 (1999-02-01), Kotowski
patent: 5905967 (1999-05-01), Botham
patent: 5923676 (1999-07-01), Sunter et al.
patent: 5938780 (1999-08-01), Panis
patent: 6000051 (1999-12-01), Nadeau-Dostie et al.
patent: 6107818 (2000-08-01), Czamara
patent: 6128759 (2000-10-01), Hansen
patent: 6184810 (2001-02-01), Burns
patent: 6191715 (2001-02-01), Fowers
patent: 6288588 (2001-09-01), Frisch
patent: 6313657 (2001-11-01), Hashimoto
patent: 6356129 (2002-03-01), O'Brien et al.
patent: 6363507 (2002-03-01), Truebenbach et al.
patent: 6449744 (2002-09-01), Hansen
patent: 6727834 (2004-04-01), Roberts et al.
patent: 2004/0051551 (2004-03-01), Sunter

Affiliated with

Also associated with

Rating

Method and device for use in DC parametric tests does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for use in DC parametric tests, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for use in DC parametric tests will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3410939