4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Chuan-Jane Chao

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ESD protection devices and methods to reduce trigger voltage

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method and test structures for measuring interconnect...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for extracting substrate coupling coefficient of a...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Method for fabricating a capacitor device with BiCMOS...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method for fabricating a capacitor device with BiCMOS...

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – Including additional component in same – non-isolated structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-583592

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