4. Radiant energy
  5. Irradiation of objects or material
  6. Irradiation of semiconductor devices

Christopher E. Obszarny

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Apparatus and method for in-situ adjustment of light transmissio

Photocopying – Projection printing and copying cameras – Step and repeat
Patent

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Electrically testable process window monitor for...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Reactive ion etch chamber wafer masking system

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means
Reexamination Certificate

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Thin resist process by sub-threshold exposure

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Patent

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Thin resist process by sub-threshold exposure

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Processing feature prior to imaging
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Profile ID: LFUS-PAI-P-365078

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