4. Semiconductor device manufacturing: process
  5. Semiconductor substrate dicing
  6. Having specified scribe region structure

Christine Hau-Riege

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Determination of permeability of layer material within...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Integrated circuit design system

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Interconnect test structure with slotted feeder lines to...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Method for assessing the reliability of interconnects

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method for quantitative detection of multiple...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Profile ID: LFUS-PAI-P-2635682

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