4. Static information storage and retrieval
  5. Floating gate
  6. Particular connection

Chin-Yuan Ko

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Method for testing semiconductor devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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One time programming memory cell using MOS device

Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3120027

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