4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Chien-Chen Chen

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Method for endpoint detection for copper CMP

Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate

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Method for endpoint detection for copper CMP

Abrading – Precision device or process - or with condition responsive... – By optical sensor
Reexamination Certificate

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Method for estimating life status of lithium battery

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Method for processing and integrating copper interconnects

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

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Method of forming conductor shielding to prevent arcing effect d

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Profile ID: LFUS-PAI-P-1740883

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