4. Static information storage and retrieval
  5. Read/write circuit
  6. Including reference or bias voltage generator

Chen-Hsin Lien

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Early triggered ESD MOSFET protection circuit and method...

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate

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Method for fabricating semiconductor device to lower...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Semiconductor device having reduced leakage and method of...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2609711

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