Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2005-10-25
2005-10-25
Jackson, Stephen W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
06958896
ABSTRACT:
An early triggered MOSFET ESD protection circuit based on reduction of the trigger voltage is described. A transient negative voltage is generated and applied to a gate of a MOSFET during a positive ESD event. The instant invention improves ESD performance, and is particularly useful for thin gate oxide of 40 Å and less.
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Chen Wei-Fan
Lien Chen-Hsin
Lin Shi-Tron
Demakis James A
Jackson Stephen W.
Winbond Electronics Corporation
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