4. Measuring and testing
  5. Speed, velocity, or acceleration
  6. Angular rate using gyroscopic or coriolis effect

Byeung-leul Lee

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Apparatus and method for driving MEMS structure and...

Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
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Method for fabricating vertical offset structure

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal
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Method of reducing notching during reactive ion etching

Etching a substrate: processes – Gas phase etching of substrate – Etching inorganic substrate
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Micro structure for vertical displacement detection and...

Measuring and testing – Speed – velocity – or acceleration
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Print head error checking apparatus and method

Incremental printing of symbolic information – Ink jet – Controller
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Profile ID: LFUS-PAI-P-2686957

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