4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Bruce F. Mielke

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Apparatus and method for margin testing single polysilicon...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Electronic circuit testing methods and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2125819

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