Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Inventor
active
Efficiency enhancement for MMIC amplifiers
Location of defects using dye penetration
Method analyzing a semiconductor surface using line width...
Method of analyzing semiconductor surface with patterned...
Method of determining accuracy error in line width metrology...
No associations
LandOfFree
Brittin C. Kane does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Brittin C. Kane, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Brittin C. Kane will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-889997