4. Surgery
  5. Instruments
  6. Orthopedic instrumentation

Brian Duffy

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Correction of overlay offset between inspection layers

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Hinged paper voting ballot

Office supplies; artists and teachers materials – Paper or pasteboard for writing or printing
Design Patent

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Locking orthopaedic clamping tool

Surgery – Instruments – Orthopedic instrumentation
Patent

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Methods and systems for detecting defects on a reticle

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Methods and systems for determining a position of inspection...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2004473

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