4. Pulse or digital communications
  5. Testing
  6. Phase error or phase jitter

Brent S. Crittenden

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Apparatus and method for defective column detection for semicond

Excavating
Patent

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Dynamic impedance matched driver for improved slew rate and...

Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination
Reexamination Certificate

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Jitter detection method and apparatus

Pulse or digital communications – Testing – Phase error or phase jitter
Patent

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Testing components in digital imaging devices

Television – Monitoring – testing – or measuring – Testing of camera
Reexamination Certificate

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Profile ID: LFUS-PAI-P-441328

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