4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Bosco Chun Sang Lai

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Method and apparatus for testing integrated circuits by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Systems and methods for testing integrated circuit devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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