4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Bipin Duggal

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Scan based testing of an integrated circuit containing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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System and method for testing memory blocks in an SOC design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2186929

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