4. Optics: measuring and testing
  5. By polarized light examination
  6. Of surface reflection

Bhola N. De

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Reduced stress sputtering target and method of manufacturing the

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering
Patent

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Self aligning in-situ ellipsometer and method of using for proce

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Profile ID: LFUS-PAI-P-157101

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