4. Semiconductor device manufacturing: process
  5. Making regenerative-type switching device
  6. Having structure increasing breakdown voltage

Ayelet Pnueli

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Kill index analysis for automatic defect classification in...

Semiconductor device manufacturing: process – Making regenerative-type switching device – Having structure increasing breakdown voltage
Reexamination Certificate

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Method and apparatus for calculating a focus metric

Photography – With exposure objective focusing means – focusing aid – or... – Processing circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2723158

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