Method and apparatus for calculating a focus metric

Details Method and apparatus for calculating a focus metric Method and apparatus for calculating a focus metric

2007-01-29

2009-12-15

Blackman, Rochelle-Ann J (Department: 2862)

Photography

With exposure objective focusing means, focusing aid, or...

Processing circuit

C396S079000, C396S093000, C396S102000, C359S698000, C348S349000, C250S201800

Reexamination Certificate

active

07634188

ABSTRACT:
A method comprises receiving a focusing image and shifting the focusing image to obtain a shifted focusing image. In the method, a focus metric of the focusing image is calculated from the focusing image and the shifted focusing image, where the focus metric is configured for use as a factor in making an automatic focus adjustment determination. An automatic focusing apparatus includes a controller configured to implement the method.

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patent: 0 122 406 (1984-10-01), None
Erasmus, S. J. et al., “An Automatic Focusing and Astigmatism Correction System for SEM and CTEM”, Journal of Microscopy vol. 127, p. 185-199, Aug. 1982.
Vollath, D., “The Influence of the Scene Parameters and of Noise on the Behaviour of Automatic Focusing Algorithms”, Journal of Microscopy vol. 151, p. 133-146, Aug. 1988.

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