Optics: measuring and testing
Dimension
Thickness
Inventor
active
Method and apparatus for monitoring a chemical mechanical...
Method and apparatus for monitoring a chemical mechanical...
Method and system for monitoring a process of material...
Optical measurements of patterned structures
Test structure for metal CMP process control
No associations
LandOfFree
Avi Ravid does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Avi Ravid, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Avi Ravid will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2081228