4. Fences
  5. Flood

Avi Ben-Gigi

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Method of decreasing charging effects in oxide-nitride-oxide...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate

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Protection against in-process charging in...

Fences – Flood
Reexamination Certificate

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Protection against in-process charging in...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2872016

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