4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

ATMEL Corporation

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Accessing sequential data in microcontrollers

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Adaptive gate voltage regulation

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
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Analog combination regulator

Electrical transmission or interconnection systems – Plural supply circuits or sources – Load current control
Reexamination Certificate

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Brownout detector system and method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Comparator chain offset reduction

Coded data generation or conversion – Converter compensation
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