4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation

Ashok V. Kulkarni

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Detecting groups of defects in semiconductor feature space

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Patent

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Interactive threshold tuning

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Outlier substrate inspection

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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System for extracting shape features from an image

Communications: electrical – Digital comparator systems
Patent

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Profile ID: LFUS-PAI-P-1330338

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