4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Anindya Saha

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At-speed ATPG testing and apparatus for SoC designs having...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Memory access system providing increased throughput rates...

Electrical computers and digital data processing systems: input/ – Input/output data processing – Direct memory accessing
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Providing optimal supply voltage to integrated circuits

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
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Testing of modules operating with different characteristics...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2976898

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