4. Electronic digital logic circuitry
  5. With test facilitating feature

Anil K. Sabbavarapu

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Flexible scan architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Scan cell systems and methods

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Test scan cells

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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