X-ray or gamma ray systems or devices
Specific application
Fluorescence
Inventor
active
Contamination and residuals inspection system
Dual-wavelength x-ray monochromator
Dual-wavelength X-ray reflectometry
Efficient measurement of diffuse X-ray reflections
Enhancement of X-ray reflectometry by measurement of diffuse...
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Profile ID: LFUS-PAI-P-818265