4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Allen S. Yu

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ADC based in-situ destructive analysis selection and...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

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Automatic defect classification comparator die selection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Automatic defect classification system based variable...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Automatic defect resizing tool

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Automatic method to eliminate first-wafer effect

Semiconductor device manufacturing: process – Including control responsive to sensed condition
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Profile ID: LFUS-PAI-P-696996

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