4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Allan Hauer

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Method and apparatus for transient unit cell measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Methods and apparatus for the control and analysis of X-rays

Radiant energy – Coded record and readers; invisible radiant energy type
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Profile ID: LFUS-PAI-P-892688

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