X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1988-02-29
1989-04-11
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 72, 378 87, G01N 2320
Patent
active
048213020
ABSTRACT:
A method and apparatus is disclosed for measuring the lattice parameters of single crystal material while that material is undergoing a transient shock wave. In a first embodiment, a first target is located at a preselected position in space with respect to a single crystal to be measured. A first laser beam pulse is transmitted through a beam block to the crystal to produce a transient shock wave in part of the crystal. A second laser beam pulse, synchronized to the first laser beam pulse, is transmitted to the first target to cause the first target to produce first and second sets of x-rays which are Bragg-diffracted from shocked and unshocked atomic planes of the crystal as the crystal is undergoing the shock wave. A first x-ray detector records the positions of the first and second sets of Bragg-diffracted x-rays to provide a first measurement of the lattice parameters of the crystal. In a second embodiment, a third laser beam pulse, synchronized to the second laser beam pulse, is transmitted to a second target to cause the second target to produce third and fourth sets of x-rays which are Bragg-diffracted from shocked and unshocked atomic planes of the crystal as the crystal is undergoing the shocke wave. A second x-ray detector records the positions of the third and fourth sets of Bragg-diffracted x-rays to provide a second measurement of the lattice parameters of the crystal.
REFERENCES:
patent: 3861199 (1975-01-01), Barkhoudarian
Hauer Allan
Wark Justin S.
Whitlock Robert R.
Howell Janice A.
Jameson George
McDonnell Thomas E.
Porta David P.
The United States of America as represented by the Secretary of
LandOfFree
Method and apparatus for transient unit cell measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for transient unit cell measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for transient unit cell measurement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-672280