Methods and apparatus for the control and analysis of X-rays

Radiant energy – Coded record and readers; invisible radiant energy type

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250273, 250505, 250514, G01N 2320

Patent

active

039913090

ABSTRACT:
Fast X-ray excitation processes such as occur during nuclear fusion reactions where high energy laser pulses hit a target, as for the purpose of stimulating atomic emission, may be analyzed by interposing a crystal in the path of the X-rays. The X-rays are transmitted through this crystal by means of the anomalous transmission or Bormann effect. A periodic strain field is established in the crystal to enable or inhibit anomalous transmission. The transmitted radiation is received by a measurement system which is operated in synchronism with the strain field. A solid state shuttering mechanism is obtained which rapidly interrupts the X-rays so that they can be measured even when produced by fast X-ray excitation processes. Various methods and apparatus for producing the periodic strain field are described, particularly electrostrictive techniques, piezoelectric techniques using separate transducers mounted on the crystal or the piezoelectric properties of the crystal itself and techniques for stimulating acoustic vibration by means of an optical beam.

REFERENCES:
patent: 3376415 (1968-04-01), Krogstad
patent: 3381127 (1968-04-01), Spielberg
patent: 3591803 (1971-07-01), Spielberg
patent: 3769507 (1973-10-01), Kenney

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and apparatus for the control and analysis of X-rays does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for the control and analysis of X-rays, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for the control and analysis of X-rays will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1727176

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.