Alfred Piorkow

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Apparatus and process for automatically measuring aperture size

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Beam splitting system for a welding laser

Electric heating – Microwave heating – Tunnel furnace
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Comparator mask for aperture measuring apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Laser scanner for photolithography of slotted mask color cathode

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Profile ID: LFUS-PAI-P-193769

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