4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Alexander Savtchouk

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Device for electrically contacting a floating semiconductor wafe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Measurement of different mobile ion concentrations in the...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method for measuring stress induced leakage current and gate...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Steady state method for measuring the thickness and the...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Steady state method for measuring the thickness and the...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1903082

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