Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1999-04-21
2000-09-05
Metjahic, Safet
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3102
Patent
active
061148652
ABSTRACT:
The invention relates to a device for contacting and electrically grounding semiconductor substrate coated with or otherwise having an insulating film positioned thereover. The device includes a chuck having a wafer support surface which holds the wafer and a scriber movably attached to the chuck. The scriber is configured to contact the wafer through an opening in the chuck and to produce a perforation through the insulating film. The device further includes an electrically conductive probe movably attached to the chuck and configured to be moved into an access opening in the chuck to contact the semiconductor substrate through the perforation. Thus, the device increases the accuracy of open circuit type measurements of the wafer surface potential, particularly for Kelvin and Monroe electrode measurements of electrical properties of insulating films on semiconductor substrates.
REFERENCES:
patent: 4812756 (1989-03-01), Curtis et al.
patent: 4950977 (1990-08-01), Garcia et al.
patent: 4978915 (1990-12-01), Andrews, Jr. et al.
patent: 5216362 (1993-06-01), Verkuil
patent: 5394101 (1995-02-01), Mitros
patent: 5410162 (1995-04-01), Tigelaar et al.
patent: 5444389 (1995-08-01), Hirae et al.
patent: 5498974 (1996-03-01), Verkuil et al.
patent: 5773989 (1998-06-01), Edelman et al.
patent: 5815000 (1998-09-01), Farnworth et al.
patent: 5847423 (1998-12-01), Yamamichi
Kochev Nick
Lagowski Jacek
Savtchouk Alexander
Schraver Charles
Metjahic Safet
Nguyen Vincent Q.
Semiconductor Diagnostics, Inc.
LandOfFree
Device for electrically contacting a floating semiconductor wafe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device for electrically contacting a floating semiconductor wafe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for electrically contacting a floating semiconductor wafe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2215912