4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Organic semiconductor material

Alexander Kadyshevitch

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Auger-based thin film metrology

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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Contact opening metrology

Radiant energy – Irradiation of objects or material
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Contact opening metrology

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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High current electron beam inspection

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Hybrid organic-inorganic semiconductor structures and...

Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material
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Profile ID: LFUS-PAI-P-2506468

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