4. Compositions
  5. Electrically conductive or emissive compositions
  6. Carbide containing

Alex V. Hamza

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Highly charged ion based time of flight emission microscope

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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Highly charged ion secondary ion mass spectroscopy

Radiant energy – Ionic separation or analysis – Methods
Reexamination Certificate

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Low work function, stable compound clusters and generation proce

Compositions – Electrically conductive or emissive compositions – Carbide containing
Patent

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Process for forming silicon carbide films and microcomponents

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Patent

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Profile ID: LFUS-PAI-P-1110853

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