Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Inventor
active
Characterization of ultra shallow junctions in semiconductor...
Ion implant monitoring through measurement of modulated...
Ion implant monitoring through measurement of modulated...
Method and system for combined photothermal modulated...
Method and system for combined photothermal modulated...
No associations
LandOfFree
Alex Salnik does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Alex Salnik, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Alex Salnik will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2329315