4. Optics: measuring and testing
  5. By alignment in lateral direction

Alex De Vries

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Device manufacturing method

Radiation imagery chemistry: process – composition – or product th – Registration or layout process other than color proofing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithographic apparatus, device manufacturing method, and...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of calibrating a lithographic apparatus, alignment...

Photocopying – Projection printing and copying cameras – Methods
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Alex De Vries does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Alex De Vries, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Alex De Vries will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2950419

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure