Method of calibrating a lithographic apparatus, alignment...

Photocopying – Projection printing and copying cameras – Methods

Reexamination Certificate

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C355S052000

Reexamination Certificate

active

10845521

ABSTRACT:
In one method of compensating for the distortion of front-to-backside alignment optics, a displacement vector between the estimated position of a substrate mark and the actual position of a substrate mark is calculated. An optical correction array is also calculated by moving a reference substrate by a fixed amount and comparing how far an image of a point on the back side of a reference substrate moves to how far a corresponding point on the front side of the substrate moves. The displacement vector and optical correction array may then be used to accurately calculate the position of further substrates.

REFERENCES:
patent: 4952060 (1990-08-01), Ina et al.
patent: 5229872 (1993-07-01), Mumola
patent: 5296891 (1994-03-01), Vogt et al.
patent: 5361132 (1994-11-01), Farn
patent: 5523193 (1996-06-01), Nelson
patent: 5929997 (1999-07-01), Lin
patent: 5969441 (1999-10-01), Loopstra et al.
patent: 6046792 (2000-04-01), Van Der Werf et al.
patent: 6117599 (2000-09-01), Lin
patent: 6198535 (2001-03-01), Hu et al.
patent: 6376329 (2002-04-01), Sogard et al.
patent: 6525805 (2003-02-01), Heinle
patent: 6861186 (2005-03-01), Pagette et al.
patent: 6898306 (2005-05-01), Lu
patent: 2002/0084565 (2002-07-01), Dautartas et al.
patent: 2002/0167649 (2002-11-01), Heinle
patent: 02251440 (2002-03-01), None
patent: 1 223 469 (2002-07-01), None
patent: 1 341 046 (2003-09-01), None
patent: 1 341 046 (2004-12-01), None
patent: 98/33096 (1998-07-01), None
patent: 98/38597 (1998-09-01), None
patent: 98/40791 (1998-09-01), None
Search Report for European Application No. 03253058.6, dated Mar. 8, 2004.
Bijnen, et al., “Front to Back Alignment Metrology”, Emerging Lithographic Technologies VII, Proceedings of SPIE vol. 5037 (2003) pp. 641-646.
European Search Report issued for European Patent Application No. 04252825.7-2222, dated Jun. 1, 2006.

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