4. 192 clutches and power-stop control
  5. Clutch and brake

Akihiko Nakano

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Apparatus and a method for checking a semiconductor

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Apparatus and a method for checking a semiconductor

Electric heating – Metal heating – By arc
Patent

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Apparatus for inspecting a semiconductor device

Optics: measuring and testing – With sample preparation
Patent

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Drive mechanism for a mechanical press

192 clutches and power-stop control – Clutch and brake
Patent

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Failure detecting apparatus for a dual valve

192 clutches and power-stop control – Clutch and brake
Patent

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Profile ID: LFUS-PAI-P-300238

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