4. Electricity: measuring and testing
  5. Conductor identification or location
  6. Inaccessible

Akella V. S. Satya

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Apparatus and methods for determining critical area of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Chemical mechanical polishing test structures and methods...

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Chemical mechanical polishing test structures and methods...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Continuous movement scans of test structures on...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dual probe test structures for semiconductor integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Akella V. S. Satya does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Akella V. S. Satya, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Akella V. S. Satya will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-459084

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure