4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Advanced Inquiry Systems, Inc.

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Apparatus for full-wafer test and burn-in mechanism

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus for providing electrical access to one or more...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Fiber-based optical alignment system

Optical waveguides – With optical coupler – With alignment device
Reexamination Certificate

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Fiber-based optical alignment system

Optical waveguides – With optical coupler – With alignment device
Reexamination Certificate

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Methods and apparatus for addition of electrical conductors...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices
Reexamination Certificate

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