4. Data processing: generic control systems or specific application
  5. Specific application, apparatus or process
  6. Product assembly or manufacturing

Abraham Ravid

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Determining physical property of substrate

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Determining physical property of substrate

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Methods and apparatus for generating a library of spectra

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
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Profile ID: LFUS-PAI-P-3148487

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