Method of forming a via overlap

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257786, 257774, H01L 2348, H01L 2352, H01L 2940

Patent

active

061664413

ABSTRACT:
Briefly, in accordance with one embodiment of the invention a method of forming at least two vias, each having a metal overlap, to interconnect at least two connection points with metallization includes the following. The at least two vias are etched through a layer of insulating material. The at least two etched vias are located diagonally with respect to one another. Metal overlap for each of the at least two vias is formed into a polygon shape having more than four sides.
Briefly, in accordance with another embodiment of the invention, an article includes: a storage medium, the storage medium having stored thereon, instructions, which, when executed, result in: the placement and routing of vias between at least two connection points to be interconnected with metallization by positioning at least two vias diagonally with respect to one another, the at least two vias being positioned so each is capable of having a polygon shape of metal overlap with more than four sides.
Briefly, in accordance with still another embodiment of the invention, an integrated cicuit includes: a semiconductor substrate, the semiconductor substrate having formed thereon an interconnect. The interconnect including at least two vias, the at least two vias being located diagonally with respect to one another and each having a metal overlap with a polygon shape of more than four sides.

REFERENCES:
patent: 4196443 (1980-04-01), Dingwall
patent: 4951101 (1990-08-01), Alter et al.
patent: 5432381 (1995-07-01), Melzner
patent: 5508564 (1996-04-01), Lee et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a via overlap does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a via overlap, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a via overlap will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-998133

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.