Semiconductor memory device having data erasing mechanism

Static information storage and retrieval – Read/write circuit – Using different memory types

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36518924, 36518928, G11C 700

Patent

active

057516367

ABSTRACT:
In this invention, charges are extracted from the charge storage portion by means of F-N tunnel current, and then avalanche hot carriers are injected into the storage portion.

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E. Takeda et al., "Device Performance Degradation Due to Hot-Carrier Injection at Energies Below the Si-SiO.sub.2 Energy Barrier", 1983 International Electron Devices Meeting, Article No. 15.5, pp. 396-399, Dec. 1983.
S. Yamada et al., "A Self-Convergence Erasing Scheme for a Simple Stacked Gate Flash EEPROM", 1991 International Electron Devices Meeting, Article No. 11.4, pp. 307-310, Dec. 1991.
K. Naruke et al., "Restraint of Variation in Threshold Voltage to 1/3, Prevention of Excessive Erasion is Flash Type EEPROM", Nikkei Microdevices, pp. 85-91, Feb. 1992.

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