Method of plasma etching amorphous carbon films

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

118 501, 156345, H01L 2162

Patent

active

049751441

ABSTRACT:
An etching method for selectively eliminating carbon material deposited on a substrate is described. A layer of masking material may be applied over areas of the carbon coating whose removal is not desired. After disposing the substrate coated with the carbon material in a CVD reaction chamber, NF.sub.3 is admitted to the chamber and converted into a plasma etchant comprising fluorine ions or radicals by inputting high frequency energy. The fluorine ions or radicals remove all unmasked carbon, leaving a carbon film pattern on the substrate which may be used in the manufacture of an IC. The carbon material elimination method can also be used for chamber cleaning to removing carbon deposited debris from the inside of the CVD reaction chamber.

REFERENCES:
patent: 4380488 (1981-11-01), Reicheldefer
patent: 4405406 (1982-06-01), Casey
patent: 4529474 (1984-01-01), Fujiyama
patent: 4657616 (1985-05-01), Benzing
patent: 4717681 (1986-05-01), Curran
patent: 4756794 (1987-08-01), Yoder
patent: 4786352 (1986-09-01), Benzing
patent: 4795880 (1988-03-01), Hayes
patent: 4816113 (1988-02-01), Yamazaki

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of plasma etching amorphous carbon films does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of plasma etching amorphous carbon films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of plasma etching amorphous carbon films will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-881638

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.