Data processing: measuring – calibrating – or testing – Calibration or correction system – Zero-full scaling
Patent
1997-10-16
1999-12-14
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Calibration or correction system
Zero-full scaling
702 22, G01N 2125
Patent
active
060029900
ABSTRACT:
A novel process is disclosed for continually or periodically correcting gas spectrometer measurements for wavelength calibration drift without interrupting the gas measurement process. The spectrometer employs certain calibration vectors for use in obtaining single component information based on a composite measurement for a multi-component gas sample. A calibration vector can be provided for each component of interest as well as an average spectrum and other spectra as desired. These calibration vectors are used to selectively compensate for spectral interference between the multiple components so as to effectively isolate and measure a selected spectral characteristic for a particular component of interest. Temperature changes and attendant variations in spectrometer dimensions or other temperature related factors can degrade measurement performance. The novel process involves deriving wavelength correction data for the spectrometer as a function of temperature, monitoring the spectrometer for temperature changes during a time period of interest, and adjusting or shifting one or more of the calibration vectors to compensate for temperature variations. By performing temperature-related adjustments based on the calibration vectors, the computational intensity of the process is greatly reduced, thereby minimizing processor burden/requirements. It is anticipated that the correction process can be continually executed as a low priority or background function in a multitasked system without requiring dedicated processor resources.
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Datex-Ohmeda Inc.
Hoff Marc S.
Miller Craig Steven
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